[IEEE 2012 IEEE International Conference on Mechatronics and Automation (ICMA) - Chengdu, China (2012.08.5-2012.08.8)] 2012 IEEE International Conference on Mechatronics and Automation - A robust white line detection technique for double circular operator
Hayashi, Naohiro; Tomizawa, Tetsuo; Suehiro, Takashi; Kudoh, Shunsuke
- 作者Hayashi, Naohiro; Tomizawa, Tetsuo; Suehiro, Takashi; Kudoh, Shunsuke
- 文件大小625.79KB
- 发表时间2012
- DOI10.1109/icma.2012.6285120
- 页码1949-1954