Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability
- 期刊名称Applied Physics Letters
- 作者Padovani, Andrea; Arreghini, Antonio; Vandelli, Luca; Larcher, Luca; bosch, Geert Van den; Houdt, Jan Van
- 卷第101卷
- 期第5期
- 印刷ISSN0003-6951
- 文件大小1074.51KB
- 发表时间2012
- DOI10.1063/1.4740255
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