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[IEEE 2012 IEEE/ASME 8th International Conference on Mechatronic and Embedded Systems and Applications (MESA) - Suzhou, China (2012.07.8-2012.07.10)] Proceedings of 2012 IEEE/ASME 8th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications - SdDirM: A dynamic defect prediction model

[IEEE 2012 IEEE/ASME 8th International Conference on Mechatronic and Embedded Systems and Applications (MESA) - Suzhou, China (2012.07.8-2012.07.10)] Proceedings of 2012 IEEE/ASME 8th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications - SdDirM: A dynamic defect prediction model

Ba, Jie; Wu, Shujian
  • 作者Ba, Jie; Wu, Shujian
  • 文件大小158.20KB
  • 发表时间2012
  • DOI10.1109/mesa.2012.6275570
  • 页码252-256
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