[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Advanced fault isolation technique using electro-optical terahertz pulse reflectometry
Tay, M. Y.; Cao, L.; Venkata, M.; Tran, L.; Donna, W.; Qiu, W.; Alton, J.; Taday, P. F.; Lin, M.
- 作者Tay, M. Y.; Cao, L.; Venkata, M.; Tran, L.; Donna, W.; Qiu, W.; Alton, J.; Taday, P. F.; Lin, M.
- 文件大小897.33KB
- 发表时间2012
- DOI10.1109/ipfa.2012.6306302
- 页码1-5