SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 22 January 2012)] Stereoscopic Displays and Applications XXIII - Supervised disparity estimation
Vandewalle, Patrick; Woods, Andrew J.; Holliman, Nicolas S.; Varekamp, Chris; Favalora, Gregg E.
- 作者Vandewalle, Patrick; Woods, Andrew J.; Holliman, Nicolas S.; Varekamp, Chris; Favalora, Gregg E.
- 卷第8288卷
- 印刷ISSN0277-786X
- 文件大小11306.67KB
- 发表时间2012
- DOI10.1117/12.908268