SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Optical System Alignment, Tolerancing, and Verification VI - Optical design and performance testing of an athermal SWIR gas correlation imager
Tanbakuchi, A.; Smith, M.; Mercier, J.; Vigil, S.; Embree, T.; Ison, A.; Sasián, José; Youngworth, Richard N.
- 作者Tanbakuchi, A.; Smith, M.; Mercier, J.; Vigil, S.; Embree, T.; Ison, A.; Sasián, José; Youngworth, Richard N.
- 卷第8491卷
- 印刷ISSN0277-786X
- 文件大小1754.48KB
- 发表时间2012
- DOI10.1117/12.928001