海量图书期刊资源，随时随地畅享阅读乐趣
[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Trends and challenges in solid state lighting reliabilityTao, Guoqiao · 2013