Functional broadside tests for embedded logic blocks
- 期刊名称IET Computers & Digital Techniques
- 作者Pomeranz, I.
- 卷第6卷
- 期第4期
- 印刷ISSN1751-8601
- 文件大小163.20KB
- 发表时间2012
- DOI10.1049/iet-cdt.2011.0163
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