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[ACM Press the 49th Annual Design Automation Conference - San Francisco, California (2012.06.03-2012.06.07)] Proceedings of the 49th Annual Design Automation Conference on - DAC '12 - Accurate process-hotspot detection using critical design rule extraction

[ACM Press the 49th Annual Design Automation Conference - San Francisco, California (2012.06.03-2012.06.07)] Proceedings of the 49th Annual Design Automation Conference on - DAC '12 - Accurate process-hotspot detection using critical design rule extraction

Yu, Yen-Ting; Chan, Ya-Chung; Sinha, Subarna; Jiang, Iris Hui-Ru; Chiang, Charles
  • 作者Yu, Yen-Ting; Chan, Ya-Chung; Sinha, Subarna; Jiang, Iris Hui-Ru; Chiang, Charles
  • 文件大小664.96KB
  • 发表时间2012
  • DOI10.1145/2228360.2228576
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