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Employing the STDF V4-2007 Standard for Scan Test Data Logging

Seuring, Markus; Braun, Michael; Ma, Alan; Eide, Geir; Yang, Kathy; Tang, Huaxing

期刊名称IEEE Design & Test of Computers
作者Seuring, Markus; Braun, Michael; Ma, Alan; Eide, Geir; Yang, Kathy; Tang, Huaxing
卷第29卷
期第6期
印刷ISSN0740-7475
文件大小623.38KB
发表时间2012-12
DOI10.1109/MDT.2012.2210533
页码91-99