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[ASME ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer - Atlanta, Georgia, USA (Saturday 3 March 2012)] ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer - Thermoelectric Characterization of Ge <sub/>2</sub> Sb <sub/>2</sub> Te <sub/>5</sub> Films for Phase-Change Memory

[ASME ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer - Atlanta, Georgia, USA (Saturday 3 March 2012)] ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer - Thermoelectric Characterization of Ge 2 Sb 2 Te 5 Films for Phase-Change Memory

Lee, Jaeho; Kodama, Takashi; Won, Yoonjin; Asheghi, Mehdi; Goodson, Kenneth E.
  • 作者Lee, Jaeho; Kodama, Takashi; Won, Yoonjin; Asheghi, Mehdi; Goodson, Kenneth E.
  • 文件大小1424.34KB
  • 发表时间2012
  • DOI10.1115/mnhmt2012-75092
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