Erratum: ``Double-layer'' method to improve image quality of industria SPECT
Park, J G; Seo, H; Kim, C H; Jung, S H; Kim, J B; Moon, J; Kim, Y S
- 期刊名称Journal of Instrumentation
- 作者Park, J G; Seo, H; Kim, C H; Jung, S H; Kim, J B; Moon, J; Kim, Y S
- 卷第7卷
- 期第1期
- 电子ISSN1748-0221
- 文件大小72.12KB
- 发表时间2012-01-10
- DOI10.1088/1748-0221/7/01/e01001