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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 16 April 2012)] Optical Micro- and Nanometrology IV - Quality assessment of aerospace materials with optical coherence tomography

SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 16 April 2012)] Optical Micro- and Nanometrology IV - Quality assessment of aerospace materials with optical coherence tomography

Liu, Ping; Gorecki, Christophe; Asundi, Anand K.; Groves, Roger M.; Benedictus, Rinze; Osten, Wolfgang
  • 作者Liu, Ping; Gorecki, Christophe; Asundi, Anand K.; Groves, Roger M.; Benedictus, Rinze; Osten, Wolfgang
  • 卷第8430卷
  • 印刷ISSN0277-786X
  • 文件大小256.33KB
  • 发表时间2012
  • DOI10.1117/12.922511
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