Phase purity and the thermoelectric properties of Ge ₂ Sb ₂ Te ₅ films down to 25 nm thickness

• 期刊名称Journal of Applied Physics
• 作者Lee, Jaeho; Kodama, Takashi; Won, Yoonjin; Asheghi, Mehdi; Goodson, Kenneth E.
• 卷第112卷
• 期第1期
• 印刷ISSN0021-8979
• 电子ISSN1089-7550
• 文件大小1510.28KB
• 发表时间2012-07
• DOI10.1063/1.4731252