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Effect of residual chips on the material removal process of the bulk metallic glass studied by in situ scratch testing inside the scanning electron microscope

Huang, Hu; Zhao, Hongwei; Shi, Chengli; Wu, Boda; Fan, Zunqiang; Wan, Shunguang; Geng, Chunyang

期刊名称AIP Advances
作者Huang, Hu; Zhao, Hongwei; Shi, Chengli; Wu, Boda; Fan, Zunqiang; Wan, Shunguang; Geng, Chunyang
卷第2卷
期第4期
电子ISSN2158-3226
文件大小1097.06KB
发表时间2012-12
DOI10.1063/1.4774032