Effect of PVD process parameters on the quality and reliability of thin (10–30
Shibesh Dutta; Sivaramakrishnan Ramesh; Balakrishnan Shankar; Sundar Gopalan
- 作者Shibesh Dutta; Sivaramakrishnan Ramesh; Balakrishnan Shankar; Sundar Gopalan
- 卷第2卷
- 期第1期
- 印刷ISSN2190-5509
- 电子ISSN2190-5517
- 文件大小354.00KB
- 发表时间2012-03
- DOI10.1007/s13204-011-0033-0
- 页码1-6