Evolution of the Structural and Electrical Properties of GeTe Under Different Annealing Conditions
- 作者Ki-Hong Kim, Yong-Koo Kyoung, Jun-Ho Lee, Yong-Nam Ham, Sang-Jun Choi
- 卷第42卷
- 期第1期
- 文件大小577.89KB
- 发表时间2013-01
- DOI10.1007/s11664-012-2262-8
- 页码78-82
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