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Novel Layout Technique for Single-Event Transient Mitigation Using Dummy Transistor

Chen, Jianjun; Chen, Shuming; He, Yibai; Qin, Junrui; Liang, Bin; Liu, Biwei; Huang, Pengcheng

期刊名称IEEE Transactions on Device and Materials Reliability
作者Chen, Jianjun; Chen, Shuming; He, Yibai; Qin, Junrui; Liang, Bin; Liu, Biwei; Huang, Pengcheng
卷第13卷
期第1期
印刷ISSN1530-4388
电子ISSN1558-2574
文件大小1039.41KB
发表时间2013-03
DOI10.1109/TDMR.2012.2227261
页码177-184