发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

Fitting Full X-Ray Diffraction Patterns for Quantitative Analysis: A Method for Readily Quantifying Crystalline and Disordered Phases

Fitting Full X-Ray Diffraction Patterns for Quantitative Analysis: A Method for Readily Quantifying Crystalline and Disordered Phases

Chipera, Steve J.; Bish, David L.
  • 期刊名称Advances in Materials Physics and Chemistry
  • 作者Chipera, Steve J.; Bish, David L.
  • 卷第3卷
  • 期第1期
  • 印刷ISSN2162-531X
  • 电子ISSN2162-5328
  • 文件大小512.44KB
  • 发表时间2013
  • DOI10.4236/ampc.2013.31A007
  • 页码47-53
← 返回【学霸图书馆】主页