Impact of NBTI/PBTIon SRAMs within microprocessor systems: Modeling, simulation, and analysis
- 期刊名称Microelectronics Reliability
- 作者Chen, Chang-Chih; Ahmed, Fahad; Milor, Linda
- 卷第53卷
- 印刷ISSN0026-2714
- 文件大小2519.45KB
- 发表时间2013-9
- DOI10.1016/j.microrel.2013.06.003
- 页码1183-1188
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