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[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Terahertz electronics: Opportunities, challenges and technologies

[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Terahertz electronics: Opportunities, challenges and technologies

Lee, T.

作者Lee, T.
文件大小494.68KB
发表时间2013
DOI10.1109/VLDI-DAT.2013.6533814
页码1-1

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