[IEEE 2013 14th International Vacuum Electronics Conference (IVEC) - Paris, France (2013.05.21-2013.05.23)] 2013 IEEE 14th International Vacuum Electronics Conference (IVEC) - Performance degradation simulation for M-type cathode based on ion bombardment
Shi, Xiaolian; Fan, Hehong; Song, Fangfang; Zhao, Xingqun; Wan, Suiren; Sun, Xiaohan
- 作者Shi, Xiaolian; Fan, Hehong; Song, Fangfang; Zhao, Xingqun; Wan, Suiren; Sun, Xiaohan
- 文件大小703.32KB
- 发表时间2013
- DOI10.1109/IVEC.2013.6571103
- 页码1-2