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[IEEE 2013 14th International Vacuum Electronics Conference (IVEC) - Paris, France (2013.05.21-2013.05.23)] 2013 IEEE 14th International Vacuum Electronics Conference (IVEC) - Performance degradation simulation for M-type cathode based on ion bombardment

[IEEE 2013 14th International Vacuum Electronics Conference (IVEC) - Paris, France (2013.05.21-2013.05.23)] 2013 IEEE 14th International Vacuum Electronics Conference (IVEC) - Performance degradation simulation for M-type cathode based on ion bombardment

Shi, Xiaolian; Fan, Hehong; Song, Fangfang; Zhao, Xingqun; Wan, Suiren; Sun, Xiaohan
  • 作者Shi, Xiaolian; Fan, Hehong; Song, Fangfang; Zhao, Xingqun; Wan, Suiren; Sun, Xiaohan
  • 文件大小703.32KB
  • 发表时间2013
  • DOI10.1109/IVEC.2013.6571103
  • 页码1-2
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