![The improvement of the accuracy of electromagnetic actuator based atomic force microscope operating in contact mode and the development of a new methodology for the estimation of control parameters and the achievement of superior image quality]()
The improvement of the accuracy of electromagnetic actuator based atomic force microscope operating in contact mode and the development of a new methodology for the estimation of control parameters and the achievement of superior image qualityMorkvenaite-Vilkonciene, Inga; Virzonis, Darius; Dzedzickis, Andrius; Bucinskas, Vytautas; Rozene, Juste; Vilkoncius, Raimundas; Vaiciulis, Dainius; Ramanaviciene, Almira; Ramanavicius, Arunas · Sensors and Actuators A: Physical · 2019