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Post-silicon debugging of PMU integration errors using behavioral models

Post-silicon debugging of PMU integration errors using behavioral models

Ain, Antara; Mukherjee, Subhankar; Dasgupta, Pallab; Mukhopadhyay, Siddhartha

期刊名称Integration, the VLSI Journal
作者Ain, Antara; Mukherjee, Subhankar; Dasgupta, Pallab; Mukhopadhyay, Siddhartha
卷第46卷
期第3期
印刷ISSN0167-9260
文件大小1042.62KB
发表时间2013-6
DOI10.1016/j.vlsi.2012.03.003
页码310-321

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