A nonlinear degradation path dependent end-of-life estimation framework from noisy observations
- 期刊名称Microelectronics Reliability
- 作者Cucu Laurenciu, N.; Cotofana, S.D.
- 卷第53卷
- 印刷ISSN0026-2714
- 文件大小563.79KB
- 发表时间2013-9
- DOI10.1016/j.microrel.2013.07.058
- 页码1213-1217
同期刊推荐
More eigenvalue estimatesWilliam B. Day · Applied Mathematics and Computation · 1975
Author index to volume 1Applied Mathematics and Computation · 1975
Editorial boardApplied Mathematics and Computation · 1975
EditorialRobert Kalaba · Applied Mathematics and Computation · 1975
MulticollinearityGerhard Tintner · Applied Mathematics and Computation · 1975
Numerical analysis and orthogonal polynomialsD. Kolb · Applied Mathematics and Computation · 1976
Model identification in linear transformation systemsJacques Delforge · Applied Mathematics and Computation · 1976
Author index to volume 2Applied Mathematics and Computation · 1976