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A new approach to the investigation of nanoparticles: Electron tomography with compressed sensing

A new approach to the investigation of nanoparticles: Electron tomography with compressed sensing

Thomas, John Meurig; Leary, Rowan; Midgley, Paul A.; Holland, Daniel J.

期刊名称Journal of Colloid and Interface Science
作者Thomas, John Meurig; Leary, Rowan; Midgley, Paul A.; Holland, Daniel J.
卷第392卷
印刷ISSN0021-9797
文件大小1418.25KB
发表时间2013-02
DOI10.1016/j.jcis.2012.09.068
页码7-14

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