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On the configuration- and frequency-dependent linearity characteristics of SiGe HBTs under different impedance matching conditions

On the configuration- and frequency-dependent linearity characteristics of SiGe HBTs under different impedance matching conditions

Qin, Guoxuan; Wang, Guogong; Jiang, Ningyue; Ma, Jianguo; Ma, Zhenqiang

期刊名称Microelectronics Reliability
作者Qin, Guoxuan; Wang, Guogong; Jiang, Ningyue; Ma, Jianguo; Ma, Zhenqiang
卷第53卷
期第3期
印刷ISSN0026-2714
文件大小457.36KB
发表时间2013-3
DOI10.1016/j.microrel.2012.09.001
页码409-413

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