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Microscopic Modeling of Electrical Stress-Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics

Microscopic Modeling of Electrical Stress-Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics

Vandelli, Luca; Padovani, Andrea; Larcher, Luca; Bersuker, Gennadi

期刊名称IEEE Transactions on Electron Devices
作者Vandelli, Luca; Padovani, Andrea; Larcher, Luca; Bersuker, Gennadi
卷第60卷
期第5期
印刷ISSN0018-9383
电子ISSN1557-9646
文件大小2245.82KB
发表时间2013-05
DOI10.1109/TED.2013.2255104
页码1754-1762

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