Compact modeling of vertical hall-effect devices: electrical behavior
- 期刊名称Analog Integrated Circuits and Signal Processing
- 作者Madec, Morgan; Schell, Jean-Baptiste; Kammerer, Jean-Baptiste; Lallement, Christophe; Hébrard, Luc
- 卷第77卷
- 期第2期
- 印刷ISSN0925-1030
- 电子ISSN1573-1979
- 文件大小928.66KB
- 发表时间2013-11
- DOI10.1007/s10470-013-0112-0
- 页码183-195