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[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - A low-cost input vector monitoring concurrent BIST scheme

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - A low-cost input vector monitoring concurrent BIST scheme

Voyiatzis, I.; Efstathiou, C.; Sgouropoulou, C.

作者Voyiatzis, I.; Efstathiou, C.; Sgouropoulou, C.
文件大小102.09KB
发表时间2013
DOI10.1109/IOLTS.2013.6604074
页码179-180

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