Space-Charge Transfer in Hybrid Inorganic-Organic Systems
- 期刊名称Physical Review Letters
- 作者Xu, Yong; Hofmann, Oliver T.; Schlesinger, Raphael; Winkler, Stefanie; Frisch, Johannes; Niederhausen, Jens; Vollmer, Antje; Blumstengel, Sylke; Henneberger, Fritz; Koch, Norbert; Rinke, Patrick; Scheffler, Matthias
- 卷第111卷
- 期第22期
- 印刷ISSN0031-9007
- 电子ISSN1079-7114
- 文件大小619.92KB
- 发表时间2013-11-27
- DOI10.1103/PhysRevLett.111.226802
[IEEE 2014 18th International Symposium on VLSI Design and Test (VDAT) - Coimbatore, India (2014.7.16-2014.7.18)] 18th International Symposium on VLSI Design and Test - VLSI design of fast fractal image encoderPanigrahy, Mamata; Chakrabarti, Indrajit; Dhar, Anindya Sundar · 2014
[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - Roadway to innovationMartino, Ronald M. · 2014
[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - Advanced CMOS reliability challengesPrasad, Chetan · 2014
[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - Design for reliability for low power digital circuitsKalpat, Sriram · 2014
[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - Design trends and test challenges in automotive electronicsWang, Li-C. · 2014
[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - Dark Silicon — A thermal perspectiveHenkel, Joerg · 2014
[IEEE 2014 27th International Conference on VLSI Design - India (2014.01.5-2014.01.9)] 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems - Call for Papers -- VLSI Design and Test Symposium (VDAT 2014)2014
[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - Will reliability limit Moore's law?Oates, Anthony S. · 2014