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[IEEE 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Istanbul, Turkey (2013.10.7-2013.10.9)] 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Power-aware SoC test optimization through dynamic voltage and frequency scaling

[IEEE 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Istanbul, Turkey (2013.10.7-2013.10.9)] 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Power-aware SoC test optimization through dynamic voltage and frequency scaling

Sheshadri, Vijay; Agrawal, Vishwani D.; Agrawal, Prathima
  • 作者Sheshadri, Vijay; Agrawal, Vishwani D.; Agrawal, Prathima
  • 文件大小323.42KB
  • 发表时间2013
  • DOI10.1109/VLSI-SoC.2013.6673258
  • 页码102-107
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