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[IEEE 2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2013) - Chenzhen, China (2013.10.20-2013.10.23)] 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - The effect of material interfaces on electrical tree growth and breakdown time of epoxy resin

[IEEE 2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2013) - Chenzhen, China (2013.10.20-2013.10.23)] 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - The effect of material interfaces on electrical tree growth and breakdown time of epoxy resin

Pattouras, M.; Tzimas, A.; Rowland, S. M.
  • 作者Pattouras, M.; Tzimas, A.; Rowland, S. M.
  • 文件大小508.58KB
  • 发表时间2013
  • DOI10.1109/ceidp.2013.6747070
  • 页码796-799
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