Temperature Dependence of Resistance in Conductive Filament Formed With Dielectric Breakdown of Ni/TiO2/Pt Structure
Otsuka, S.; Hamada, Y.; Shimizu, T.; Shingubara, S.
- 期刊名称ECS Transactions
- 作者Otsuka, S.; Hamada, Y.; Shimizu, T.; Shingubara, S.
- 卷第58卷
- 期第5期
- 印刷ISSN1938-6737
- 电子ISSN1938-5862
- 文件大小271.20KB
- 发表时间2013-08-31
- DOI10.1149/05805.0027ecst
- 页码27-31