[IEEE 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2013.06.3-2013.06.5)] 2013 IEEE International Conference of Electron Devices and Solid-state Circuits - A chip-level integrated optical spectrometer based on pit interferometers
Tao Yang, ; Yuchao Chen, ; Xing'ao Li, ; Wei Huang, ; Qianjin Wang, ; Yongyuan Zhu, ; Hopui Ho,
- 作者Tao Yang, ; Yuchao Chen, ; Xing'ao Li, ; Wei Huang, ; Qianjin Wang, ; Yongyuan Zhu, ; Hopui Ho,
- 文件大小384.09KB
- 发表时间2013
- DOI10.1109/edssc.2013.6628188
- 页码1-2