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[IEEE 2013 14th International Workshop on Microprocessor Test and Verification (MTV) - Austin, TX, USA (2013.12.11-2013.12.13)] 2013 14th International Workshop on Microprocessor Test and Verification - Dynamic Selection of Trace Signals for Post-Silicon Debug

[IEEE 2013 14th International Workshop on Microprocessor Test and Verification (MTV) - Austin, TX, USA (2013.12.11-2013.12.13)] 2013 14th International Workshop on Microprocessor Test and Verification - Dynamic Selection of Trace Signals for Post-Silicon Debug

Basu, Kanad; Mishra, Prabhat; Patra, Priyadarsan; Nahir, Amir; Adir, Alon

作者Basu, Kanad; Mishra, Prabhat; Patra, Priyadarsan; Nahir, Amir; Adir, Alon
文件大小731.21KB
发表时间2013
DOI10.1109/mtv.2013.13
页码62-67

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