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[IEEE 2013 IEEE 10th International Conference on ASIC (ASICON 2013) - Shenzhen, China (2013.10.28-2013.10.31)] 2013 IEEE 10th International Conference on ASIC - A 65-nm CMOS P-well/Deep N-well avalanche photodetector for integrated 850-nm optical

[IEEE 2013 IEEE 10th International Conference on ASIC (ASICON 2013) - Shenzhen, China (2013.10.28-2013.10.31)] 2013 IEEE 10th International Conference on ASIC - A 65-nm CMOS P-well/Deep N-well avalanche photodetector for integrated 850-nm optical

Pan, Quan; Hou, Zhengxiong; Yipeng Wang, ; Yue, C. Patrick

作者Pan, Quan; Hou, Zhengxiong; Yipeng Wang, ; Yue, C. Patrick
文件大小522.98KB
发表时间2013
DOI10.1109/asicon.2013.6811921
页码1-4

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