Dynamic Coupled Fault Diagnosis With Propagation and Observation Delays
Zhang, Shigang; Pattipati, Krishna R.; Hu, Zheng; Wen, Xisen; Sankavaram, Chaitanya
- 期刊名称IEEE Transactions on Systems, Man, and Cybernetics: Systems
- 作者Zhang, Shigang; Pattipati, Krishna R.; Hu, Zheng; Wen, Xisen; Sankavaram, Chaitanya
- 卷第43卷
- 期第6期
- 印刷ISSN2168-2216
- 电子ISSN2168-2232
- 文件大小898.41KB
- 发表时间2013-11
- DOI10.1109/tsmc.2013.2244209
- 页码1424-1439