Observing electronic structures on
<i>ex-situ</i>
grown topological insulator thin films

Observing electronic structures on ex-situ grown topological insulator thin films

Yao, S. H.; Zhou, B.; Lu, M. H.; Liu, Z. K.; Chen, Y. B.; Analytis, J. G.; Brüne, C.; Dang, W. H.; Mo, S.-K.; Shen, Z.-X.; Fisher, I. R.; Molenkamp, L. W.; Peng, H. L.; Hussain, Z.; Chen, Y. L.

期刊名称physica status solidi (RRL) - Rapid Research Letters
作者Yao, S. H.; Zhou, B.; Lu, M. H.; Liu, Z. K.; Chen, Y. B.; Analytis, J. G.; Brüne, C.; Dang, W. H.; Mo, S.-K.; Shen, Z.-X.; Fisher, I. R.; Molenkamp, L. W.; Peng, H. L.; Hussain, Z.; Chen, Y. L.
卷第7卷
印刷ISSN1862-6254
文件大小349.94KB
发表时间2013-02
DOI10.1002/pssr.201206400
页码130-132

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Observing electronic structures on ex-situ grown topological insulator thin films