[IEEE 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Osaka, Japan (2013.3.25-2013.3.28)] 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) - On the length of THRU standard for TRL de-embedding on Si substrate above 110 GHz
Orii, A.; Suizu, M.; Amakawa, S.; Katayama, K.; Takano, K.; Motoyoshi, M.; Yoshida, T.; Fujishima, M.
- 作者Orii, A.; Suizu, M.; Amakawa, S.; Katayama, K.; Takano, K.; Motoyoshi, M.; Yoshida, T.; Fujishima, M.
- 文件大小3266.90KB
- 发表时间2013
- DOI10.1109/icmts.2013.6528150
- 页码81-86