[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Microscopic origin of random telegraph noise fluctuations in aggressively scaled RRAM and its impact on read disturb variability
Raghavan, N.; Degraeve, R.; Fantini, A.; Goux, L.; Strangio, S.; Govoreanu, B.; Wouters, D. J.; Groeseneken, G.; Jurczak, M.
- 作者Raghavan, N.; Degraeve, R.; Fantini, A.; Goux, L.; Strangio, S.; Govoreanu, B.; Wouters, D. J.; Groeseneken, G.; Jurczak, M.
- 文件大小906.39KB
- 发表时间2013
- DOI10.1109/irps.2013.6532042