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Scanning Probe Microscopy in Industrial Applications (Nanomechanical Characterization) || Overview of Atomic Force Microscopy

Scanning Probe Microscopy in Industrial Applications (Nanomechanical Characterization) || Overview of Atomic Force Microscopy

Yablon, Dalia G.
  • 作者Yablon, Dalia G.
  • 文件大小197.67KB
  • 发表时间2013
  • DOI10.1002/9781118723111.ch1
  • 页码1-14
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