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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection - A background light resistant TOF range finder with integrated PIN photodiode in 0.35μm CMOS

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection - A background light resistant TOF range finder with integrated PIN photodiode in 0.35μm CMOS

Davidovic, Milos; Remondino, Fabio; Shortis, Mark R.; Seiter, Johannes; Hofbauer, Michael; Beyerer, Jürgen; Puente León, Fernando; Gaberl, Wolfgang; Zimmermann, Horst
  • 作者Davidovic, Milos; Remondino, Fabio; Shortis, Mark R.; Seiter, Johannes; Hofbauer, Michael; Beyerer, Jürgen; Puente León, Fernando; Gaberl, Wolfgang; Zimmermann, Horst
  • 卷第8791卷
  • 印刷ISSN0277-786X
  • 文件大小696.39KB
  • 发表时间2013
  • DOI10.1117/12.2021021
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