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Evaluation of Residual Stresses at the Interface with Implant by Synchrotron Radiation

Evaluation of Residual Stresses at the Interface with Implant by Synchrotron Radiation

Benmarouane, Abdelilah; Citterio, Hélène; Millet, Pierre; Buslaps, Thomas; Lodini, Alain
  • 期刊名称Materials Science Forum
  • 作者Benmarouane, Abdelilah; Citterio, Hélène; Millet, Pierre; Buslaps, Thomas; Lodini, Alain
  • 卷第772卷
  • 电子ISSN1662-9752
  • 文件大小654.06KB
  • 发表时间2013-11
  • DOI10.4028/www.scientific.net/MSF.772.135
  • 页码135-139
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