[IEEE 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna, Italy (2013.06.30-2013.07.4)] 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Degradation behaviour of solid insulation under cryogenic conditions
Truong, L. H.; Lewin, P. L.
- 作者Truong, L. H.; Lewin, P. L.
- 文件大小1481.90KB
- 发表时间2013
- DOI10.1109/icsd.2013.6619753
- 页码640-643