发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

AIP Conference Proceedings [AIP PROCEEDING OF INTERNATIONAL CONFERENCE ON RECENT TRENDS IN APPLIED PHYSICS AND MATERIAL SCIENCE: RAM 2013 - Bikaner, Rajasthan, India (1–2 February 2013)]  - Determination of refractive index and thickness of thin-film from reflectivity spectrum using genetic algorithm

AIP Conference Proceedings [AIP PROCEEDING OF INTERNATIONAL CONFERENCE ON RECENT TRENDS IN APPLIED PHYSICS AND MATERIAL SCIENCE: RAM 2013 - Bikaner, Rajasthan, India (1–2 February 2013)] - Determination of refractive index and thickness of thin-film from reflectivity spectrum using genetic algorithm

Patel, Sanjaykumar J.; Kheraj, Vipul
  • 作者Patel, Sanjaykumar J.; Kheraj, Vipul
  • 印刷ISSN0094-243X
  • 文件大小231.64KB
  • 发表时间2013
  • DOI10.1063/1.4810324
  • 页码509-510
← 返回【学霸图书馆】主页