发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

AIP Conference Proceedings [AIP PROCEEDING OF INTERNATIONAL CONFERENCE ON RECENT TRENDS IN APPLIED PHYSICS AND MATERIAL SCIENCE: RAM 2013 - Bikaner, Rajasthan, India (1–2 February 2013)] - Calibration of CR39 track etch detectors using 600 a MeV Si[sup 14+] ion beam

AIP Conference Proceedings [AIP PROCEEDING OF INTERNATIONAL CONFERENCE ON RECENT TRENDS IN APPLIED PHYSICS AND MATERIAL SCIENCE: RAM 2013 - Bikaner, Rajasthan, India (1–2 February 2013)] - Calibration of CR39 track etch detectors using 600 a MeV Si[sup 14+] ion beam

Kumar, Ashavani; Gupta, Renu

作者Kumar, Ashavani; Gupta, Renu
印刷ISSN0094-243X
文件大小120.21KB
发表时间2013
DOI10.1063/1.4810619
页码1099-1100

← 返回【学霸图书馆】主页