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[ACM Press the 45th annual ACM symposium - Palo Alto, California, USA (2013.06.01-2013.06.04)] Proceedings of the 45th annual ACM symposium on Symposium on theory of computing - STOC '13 - Every locally characterized affine-invariant property is testable

[ACM Press the 45th annual ACM symposium - Palo Alto, California, USA (2013.06.01-2013.06.04)] Proceedings of the 45th annual ACM symposium on Symposium on theory of computing - STOC '13 - Every locally characterized affine-invariant property is testable

Bhattacharyya, Arnab; Fischer, Eldar; Hatami, Hamed; Hatami, Pooya; Lovett, Shachar
  • 作者Bhattacharyya, Arnab; Fischer, Eldar; Hatami, Hamed; Hatami, Pooya; Lovett, Shachar
  • 文件大小617.61KB
  • 发表时间2013
  • DOI10.1145/2488608.2488662
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