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Scanning Probe Microscopy for Energy Research || CONDUCTING-PROBE ATOMIC FORCE MICROSCOPY OF ELECTROCHEMICAL INTERFACES

Scanning Probe Microscopy for Energy Research || CONDUCTING-PROBE ATOMIC FORCE MICROSCOPY OF ELECTROCHEMICAL INTERFACES

Bonnell, Dawn A; Kalinin, Sergei V

作者Bonnell, Dawn A; Kalinin, Sergei V
文件大小3797.28KB
发表时间2013
DOI10.1142/9789814434713_0014
页码371-391

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