SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Computational Imaging XI - Real-time dynamic range and signal to noise enhancement in beam-scanning microscopy by integration of sensor characteristics, data acquisition hardware, and statistical methods
- 作者Kissick, David J.; Muir, Ryan D.; Sullivan, Shane Z.; Oglesbee, Robert A.; Simpson, Garth J.; Bouman, Charles A.; Pollak, Ilya; Wolfe, Patrick J.
- 卷第8657卷
- 印刷ISSN0277-786X
- 文件大小396.64KB
- 发表时间2013
- DOI10.1117/12.2008607
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